• Fully automatic panel loading and unloading, capable of lighting the short-bar or full contact TFT-LCD (cell segment) panels, allowing tilted visual inspection or 80-degree angled AOI (optional)
• Customized scope for LCDs
• Automatic size adjustment for LCD inspection
• Universal probe table
• Adjustable probe unit designs, ease to maintain
• Universal inspection table
• Addressing device available
• Supports lighting for shorting bar / quick / GOA / 1D1G / full contact

• High-precision gantry structure contact head which conducts EL testing using customized probe card
• Lift bar type corresponding to the thinning of glass substrates
• ESD electrostatic protection system (ionized bar / ESD sensor / fluorine protective coating on the stage / lift bar servo control system) guarantees product safety

KLIV is an equipment that conducts EL testing and optical testing using electrode patterns formed by LED wafer chips
During the EL testing, the prober lights up the dies and measure the optical features of such chips, including optical data such as main wavelength, peak wavelength, and color temperature. The product supports LED features such as forward voltage, leakage current, and reverse breakdown voltage.